Polytec has added a motorized XY positioning unit with a travel range of 100 mm and a motorized tilt-tilt platform to its TopMap Micro.View series of optical 3D profilometers. This transforms the compact white light interferometer into a fully-fledged benchtop measuring station for 2D and 3D profiles of roughness, texture, finish, microstructures, scratches, and defects—with sub-nanometer resolution.
The true stitching mode enables the reliable merging of several individual measuring fields, even beyond their edge areas.
Repeatable measurements in the laboratory and in QA
Functions such as Focus Finder, Focus Tracker, and automatic centering increase measurement speed and reproducibility. Different lenses from 0.6X to 111X allow adaptation to matte or reflective surfaces. The 0.6X lens expands the image field to up to 15.53 × 11.71 mm² and, in addition to classic roughness measurement, also enables large-area shape and topography analyses.
For precision parts, wafers, and multi-sample analyses
With the motorized 100 mm stage, the systems are suitable for inspecting larger precision parts, 4" wafers, microsystem arrays, and for tray and multi-sample measurements. The expanded TopMap Micro.View series thus addresses the requirements of modern quality control and surface analysis in industry and research.