For the exact alignment of confocal chromatic sensors and interferometers, the new mounting adapter JMA-Thickness is now available from Micro-Epsilon. The adapter enables congruent alignment of the measuring points and thus prevents offset measurement at different points.
With the help of the mounting adapter, the sensors can be attached quickly and easily. After sensor alignment, the measuring system can be installed in the plant and the mounting plate removed again if necessary. Thanks to the precisely aligned sensors, thickness measurements can be carried out with maximum precision. The mounting adapter is secured against unintentional adjustment.