Micro-Epsilon's reflectCONTROL sensors use phase-measuring deflectometry to generate a high-resolution 3D point cloud from projected stripe patterns. This allows unevenness, scratches, and even the smallest shape deviations on highly reflective or transparent surfaces to be reliably detected.
The RCS130-160 3D HLP, optimized for use in production lines, is equipped with a GigE Vision interface and can be seamlessly integrated into existing image processing systems.
Nanometer-precise resolution for industrial applications
With a z-resolution in the nanometer range, a repeat accuracy of < 1 µm, and up to five million 3D data points, the system is suitable for demanding measurement tasks—such as shape measurement on wafers or inspection of painted automotive components during surface control.
Micro Epsilon can be found at PaintExpo in Hall 1, Booth 1131.