On 24 and 25 June, LUM France and LUM GmbH will be holding their expert days on particle characterization at the LUM France headquarters in Plaisir (Paris). This time the focus will be on the LUMiSpoc. The event is primarily aimed at customers from France. They will receive training on the LUM GmbH measuring devices by measuring their own samples.
Measurement of particle size distribution and particle concentration
The LUMiSpoc is a sophisticated single particle analysis system, similar to a flow cytometer, which measures the particle size distribution and concentration of nano- and microparticles in suspensions and emulsions with high resolution and a wide dynamic range. The instrument uses patented SPLS technology, which records light scattered by individual nano- and microparticles in forward and sideways directions while passing a laser beam with a special beam cross-section. It provides insight into complex nano- and sub-microparticle systems that can be used to design customized particles and dispersions.
Expert presentations on site
Experts Elia Wollik and Sylvain Gressier will be speaking on site. Elia Wollik is Senior Product Specialist at LUM GmbH, specializing in nanoparticle analysis and optical measurement techniques. He was instrumental in the development and market launch of the LUMiSpoc. Wollik holds a Master's degree in Pharmaceutical and Chemical Technology with a focus on particle analysis and light scattering. Sylvain Gressier, manager of the French subsidiary of LUM GmbH, has 13 years of practical and theoretical experience in France in the use of LUM measuring instruments for micro- and nanoparticle characterization, for direct accelerated stability tests of dispersions and emulsions as well as for material testing.