Mahr: Measuring contour and roughness from a quantity of one

Anzeige Measuring and testing | Created by SP

With the new MarSurf CD 140 AF contour measuring device from Mahr, the contours and roughness of individual workpieces can be measured quickly and easily. This ensures flexible handling for the user.

The new contour measuring device from Mahr offers a wide range of contour measuring functions, allowing users to easily measure both standardized and individual test specimens. The MarSurf CD 140 AF can be optionally extended with the roughness measurement function (Rz >2 μm).

Height-adjustable clamping device stand

The flexible workpiece holder makes handling easy. The height-adjustable clamping device stand in combination with standardized clamping fixtures ensures correct positioning of the workpieces. The intelligent probe system and the magnetic probe tip holder ensure easy, tool-free probe tip changes without recalibration. The automatic stylus force selection ensures the correct stylus force when changing several stylus tips.

Sophisticated functions, practical design

The MarWin software platform is used to create programs or perform individual measurements. The X-axis is designed for a maximum measuring length of up to 140 mm. Thanks to its travel speed of up to 200 mm/s, the operator can quickly move to the desired measuring point.

Back