How can functional thin-film systems be characterized reliably and efficiently - from basic research to series production? This central question is the focus of the workshop "Characterization in Thin Film Technology", which the European Research Society Thin Films e. V. (EFDS) is organizing on 10 and 11 November 2025 in Linz (Austria). The event will be hosted by RECENDT - Research Center for Non-Destructive Testing GmbH.
The demands on modern coating systems are constantly increasing - as is the importance of precise and robust characterization methods. Industrial applications in particular require inline-capable, automatable methods that provide reliable data on coating thickness, homogeneity, adhesive strength or functionality - often in the nanometer range. The two-day workshop brings together experts from industry, research and metrology to discuss current challenges, practical solutions and future-oriented technologies.
From nano to AI: solutions for real challenges
The program includes contributions on mechanical testing (nanoindentation, micropillar testing), corrosion characterization, analytical microstructure analysis (atom probe tomography) and laser acoustic spectroscopy. The spectrum is supplemented by hyperspectral analysis, laser ultrasound and AI-supported process monitoring. Digitalization, simulation and artificial intelligence approaches play a special role, for example in the prediction of service life or the development of data-based testing methods.
With keynote speeches by experts from leading companies and research institutions - including Schaeffler, Zeiss, Fraunhofer, Montanuniversität Leoben and many more - the workshop offers an interdisciplinary platform for the exchange of experience, technology transfer and strategic networking. Whether tribological systems, hydrogen technologies or EUV lithography - the solutions presented address specific applications with high innovation potential.
Further information on the program and registration can be found at: https://efds.org/event/workshop-charakterisierung/